Štátna vedecká knižnica v Košiciach - Hlavná 10, 042 30 Košice, tel. +421918245888, e-mail: svkk@svkk.sk Skip to content Forgot Password
VuFind
  • 0 items (Full)
  • Sign up
  • Log Out
  • Institutional Login
  • Studyroom
    • Book studyroom
    • American Center
    • Serial studyroom
    • Germen Library
    • Studyroom Main Hall
    • Regional publication
    • Rare and old books
  • Digital collection
    • Books
    • Newspapers
    • E-book
    • Records
  • Language
    • Slovenčina
    • English
Advanced
  • Channels
  • Spectroscopic methods for optical analysis of thin films /
Search for more channels:

Similar Items: Spectroscopic methods for optical analysis of thin films /

Optics of thin films : an optical multilayer theory /

Optical studies of rough surfaces and systems substrate - thin film with rough boundaries /

Optical and spectroscopic properties of glass /

Spectroscopic analysis of K type giants /

Solvent extraction in flame spectroscopic analysis /

Physics of thin films /

Problems of Thin Films /

Physics of Thin Films /

Physics of thin films /

Optical studies of rough surfaces and systems substrate : thin films with rough boundaries /

Thin Film Physics.

Thin-film MIS structures /

The relation of thin films to corrosion.

Handbook of thin film technology

Hard carbon thin films /

Photometric and spectroscopic studies 1 Photometric solution of TX UMa 2 Synthetic molecular spectrum of C2

Electrical conduction in thin metal films /

Vacuum Technology, Thin Films, and Sputtering, An Introduction

Evaluation of chemically degraded wood and cellulose using the spectroscopic methods : [scientific monography] /

Physics of thin films : proceesings of 1st National Autumn School, Szczyrk, Oktober 19th-25th, 1979 /

Author: Ohlídal, Ivan, 1945-

Optical studies of rough surfaces and systems substrate : thin films with rough boundaries /

Spectroscopic methods for optical analysis of thin films /

Author: Navrátil, Karel

Fyzikální měření /

Spectroscopic methods for optical analysis of thin films /

Optical studies of rough surfaces and systems substrate - thin film with rough boundaries /

Fyzikální měření. I. /


Search Options

  • Search History
  • Advanced Search

Find More

  • Browse the Catalog
  • Browse Alphabetically
  • Explore Channels
  • New Items

More opac

  • Historical fonds
  • Bibliography
  • Online name card catalog

Need Help?

  • Search Tips
  • FAQs