Fatigue crack growth under spectrum loads /

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Bibliographic Details
Other Authors: Wei, R. P. (Editor), Stephens, R. I. (Editor)
Format: Book
Language:English
Published: Philadelphia : American Society for Testing and Materials, 1976
Edition:1st ed.
Series:ASTM special technical publication 595
Subjects:
ISBN: (viaz.)
Physical Description: 339 s.
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Physical Description:339 s.
ISBN:(viaz.)