Computed electron micrographs and defact identification /
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Amsterdam ; London ; New York :
North-Holland Publication Comp.,
1973.
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| Series: | Defects in crystalline solids
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| Physical Description: |
400 strán. |
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| Item Description: | Záznam revízie |
|---|---|
| Physical Description: | 400 strán. |