VLSI fault modeling and testing techniques. /

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Bibliographic Details
Main Author: Zobrist, George W. (Adapter)
Format: Book
Language:English
Published: Norwood : Ablex Publishing Corporation, 1993
Edition:1. vyd.
Subjects:
ISBN: 0893917818 (viaz.)
Physical Description: 199 s.
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Description
Physical Description:199 s.
ISBN:0893917818 (viaz.)