Learning curves and technology assessment. /

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Bibliographic Details
Main Authors: Mac Donald, Alan (Author), Schrattenholzer, Leo (Author)
Format: Book
Language:English
Published: Laxenburg : International Institute for Applied Systems Analysis, 2003
Edition:1. vyd.
Subjects:
ISBN: (brož.)
Physical Description: S. 718-745.
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Description
Item Description:Separát z: International journal of technology management, 23(7/8).
Physical Description:S. 718-745.
ISBN:(brož.)