Secondary ion mass spectrometry SIMS V. proceedings of the 5th international conference, Washington, DC, September 30 - October 4, 1985 /
Uložené v:
| Ďalší autori: | |
|---|---|
| Médium: | Kniha |
| Jazyk: | English |
| Vydané: |
Berlin Heidelberg New York :
Springer-Verlag,
1986.
|
| Vydanie: | 1st ed. |
| Edícia: | Springer series in chemical physics
vol. 44 |
| ISBN: |
(viaz.) |
| Fyzický popis: |
561 s. : il. |
| Tagy: |
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| 245 | 0 | 0 | |a Secondary ion mass spectrometry SIMS V. proceedings of the 5th international conference, Washington, DC, September 30 - October 4, 1985 / |c edit. Alfred Benninghoven ... [et al.]. |
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| 490 | 1 | |a Springer series in chemical physics |v vol. 44 | |
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