Secondary ion mass spectrometry SIMS V. proceedings of the 5th international conference, Washington, DC, September 30 - October 4, 1985 /
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| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin Heidelberg New York :
Springer-Verlag,
1986.
|
| Edition: | 1st ed. |
| Series: | Springer series in chemical physics
vol. 44 |
| ISBN: |
(viaz.) |
| Physical Description: |
561 s. : il. |
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