Comparison of X-ray line profile and dip test measurements of internal stresses during high temperature creep of copper

by Dobeš, Ferdinand, Milička, Karel, Schafler, Erhard, Zehetbauer, Michael
Source: 1. Kovové materiály 1. 0023-432X 1. Roč. 41, č. 2 (2003), s. 133-144

Texture of equal channel angular pressed Cu investigated by electron back scatter diffraction and X-ray diffraction

by Kopacz, Ireneusz, Pippan, Reinhard, Schafler, Erhard, Stuewe, Hein-Peter
Source: 1. Kovové materiály 1. 0023-432X 1. Roč. 43, č. 6 (2005), s. 422-431

Texture of equal channel angular pressed Cu investigated by electron back scatter diffraction and X-ray diffraction

by Kopacz, Ireneusz, Pippan, Reinhard, Schafler, Erhard, Stuewe, Hein-Peter
Source: 1. Kovové materiály 1. 0023-432X 1. Roč. 43, č. 6 (2005), s. 422-431