EXAFS spectroscopy : techniques and applications /

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Bibliographic Details
Other Authors: Teo, B. K. (Editor), Joy, David C., 1943- (Editor)
Format: Book
Language:English
Published: New York : London. Plenum Press, 1981
Edition:1st ed.
ISBN: 0-306-40654-3 (viaz.)
Physical Description: viii, 275 s. : il.
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Description
Item Description:"Extended X-ray absorption fine structure"--Obálka
"Based on the proceedings of a Symposium on the Applications of EXAFS to Materials Science, held at the 1979 Meeting of the Materials Research Society, November 26-30, 1979, in Boston, Massachusetts"--Na rubu tit. listu
Obsahuje bibliografické odkazy
Physical Description:viii, 275 s. : il.
ISBN:0-306-40654-3 (viaz.)